Journal 9 페이지 | 한국에너지공대 IOEM

Information & Opto-Energy Materials (IOEM) Laboratory
Kentech 정보·광에너지 소재 연구실

Journal

2010년 이전
83
Evidence for the formation of n+-GaAs in Pd/Ge ohmic contact… J.-L.Lee, Y.-T.Kim, J.S.Kwak, H. K. Baik, A.Uedono, S. Tanigawa, J. Appl. Phys., 82, 5460-5464 (1997)
82
Suppression of silicide formation in Ta/Si system by ion-bea… J.S.Kwak, H.K.Baik, J.H.Kim, S.-M.Lee, Appl. Phys. Lett., 71, 2451-2453 (1997)
81
Investigation of Co/SiC interface reaction S.W.Park, Y.I.Kim, J.S.Kwak, H.K.Baik, J. Electron. Mater., 26, 172-177 (1997)
80
Interfacial reaction and electrical property of Ge/Ni/ZnSe f… D.W.Kim, J.S.Kwak, H.-S.Park, H.N.Kim, H.K.Baik, S.M.Lee, S.K.Noh, C.S.Kim, J. Electron. Mater., 26, 83-89 (1997)
79
The effectiveness of Ta prepared by ion-assisted deposition … B.-S.Kang, S.-M. Lee, J.S.Kwak, D.-S.Yoon, H.K.Baik, J. Electrochem. Soc., 144, 1807-1812 (1997)
78
Interfacial reaction and formation mechanism of epitaxial Co… G.B.Kim, J.S.Kwak, H.K.Baik, S.-M.Lee, J. Appl. Phys., 82, 2323-2328 (1997)
77
Improvement of Ta diffusion barrier performance in Cu metall… J.S.Kwak, H.K.Baik, J.H.Kim, S.-M.Lee, Appl. Phys. Lett., 72, 2832-2834 (1998)
76
Improved Uniformity of Contact Resistance in GaAs MESFET usi… J.S.Kwak, J.-L.Lee, H.K.Baik, IEEE Electron Dev. Lett., 19, 481-483 (1998)
75
Study on Ta diffusion barrier in Al/Si system J.Kim, D.-S.Yoon, J.S.Kwak, H.K.Baik, S.-M.Lee, J. Electron. Mater., 28, 6-12 (1999)
74
Effects of CeO2 incorporation on the performance of a Ta dif… J.Kim, J.S.Kwak, D.-S.Yoon, H.K.Baik, S.-M.Lee, J. Appl. Phys., 85, 2170-2174 (1999)
73
The effectiveness of a thin refractory metal layer inserted … J.-H.Kim, S.-M.Lee, J.S.Kwak, H.K.Baik, H.J.Ryu, J.H.Je, J. Korean Physical Society, 35, S349-S352 (1999)
72
Effect of Ti-capping thickness on the formation of an oxide-… G.B.Kim, J.S.Kwak, H.K.Baik, S.-M.Lee, J. Appl. Phys., 85, 1503-1507 (1999)
71
Ex-situ formation of oxide-interlayer-mediated-epitaxial CoS… G.B.Kim, J.S.Kwak, H.K.Baik, S.-M.Lee, J. Vac. Sci. Tech. B, 17, 162-165 (1999)
70
The effect of thin V insertion layer into Ta film on the per… J.S.Kwak, H.K.Baik, J.-H.Kim, S.-M.Lee, H.J.Ryu, J.H.Je, J. Appl. Phys., 85, 6898-6903 (1999)
69
The ohmic contact formation mechanism of Au/Pt/Pd ohmic cont… 26. D.W.Kim, H.-S.Park, J.S.Kwak, H.K.Baik, S.M.Lee, J. Electron. Mater., 28, 939-943 (1999)

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