Effect of penetration depth on electrical properties in Pd/Ge/Ti/Au ohmic contact to high-low doped n-GaAs 1996

• Year of publication

  2010년 이전

• Author

  J.S.Kwak, J.-L.Lee, H.K.Baik, D.S.Shin, C.G.Park, H.Kim

• Journal

  Jpn. J. Appl. Phys.

• Volume

  35

• Page

  3841-3843