Effects of Nb2O5 and SiO2 buffer layers on the suppression of potassium out-diffusion into indium tin oxide electrode formed on chemically strengthened glass 2014
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Year of publication
2014
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Author
C.-H. Hong J.-H. Shin, N.-M. Park, K.-H. Kim, B.-S. Kim, J. S. Kwak, B.-K. Ju, and W.-S. Cheong
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Journal
Japanese Journal of Applied Physics
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Volume
53
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Page
08NG01