• Information & Opto-Energy Materials (IOEM) Laboratory
  • Kentech 정보·광에너지 소재 연구실

Journal
Reduction of Gate Leakage Current on AlGaN/GaN High Electron Mobility Transistors by Electron-Beam Irradiation 2013
  • Year of publication

    2013

  • Author

    S. K. Oh, C. G. Song, T. Jang, K.-C. Kim, Y. J. Jo, and J. S. Kwak

  • Journal

    Journal of Nanoscience and Nanotechnology

  • Volume

    13

  • Page

    1738–1740

.