• Information & Opto-Energy Materials (IOEM) Laboratory
  • Kentech 정보·광에너지 소재 연구실

Journal
Failure Analysis of InGaN/GaN High Power Light-Emitting Diodes Fabricated with ITO Transparent p-Type Electrode During Accelerated Electro-Thermal Stress 2012
  • Year of publication

    2012

  • Author

    S.M. Moon, Y.D. Kim, S.K. Oh, M.J. Park, and J.S. Kwak

  • Journal

    J.of Nanoscience and Nanotechnology

  • Volume

    12

  • Page

    4177-4180

.