Failure Analysis of InGaN/GaN High Power Light-Emitting Diodes Fabricated with ITO Transparent p-Type Electrode During Accelerated Electro-Thermal Stress 2012
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Year of publication
2012
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Author
S.M. Moon, Y.D. Kim, S.K. Oh, M.J. Park, and J.S. Kwak
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Journal
J.of Nanoscience and Nanotechnology
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Volume
12
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Page
4177-4180